Journal article
Achromatic elemental mapping beyond the nanoscale in the transmission electron microscope
KW Urban, J Mayer, JR Jinschek, MJ Neish, NR Lugg, LJ Allen
Physical Review Letters | AMER PHYSICAL SOC | Published : 2013
Abstract
Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L2,3 core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 Å. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images. © 2013 American Physical Society.
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Grants
Awarded by Australian Research Council
Funding Acknowledgements
The financial support of the German Federal Ministry for Science and Education, the Ministry of Innovation of the State of North-Rhine Westphalia, the German Research Foundation (DFG) and the Helmholtz Association for the PICO project is gratefully acknowledged. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Project No. DP110102228). Special thanks are due to C. L. Jia and L. Jin for providing the silicon samples and for assistance with Digital Micrograph (TM).